Kontur ve yüzey ölçüm sistemiChotest
SJ5760
Kontur ve yüzey ölçüm sistemi
Chotest
SJ5760
EXW sabit fiyat KDV hariç
€18.900
Üretim yılı
2024
Durumu
Makineyi görüntüle
Konum
Leonberg 

Resimleri göster
Haritayı göster
Makineye ait bilgiler
- Makine tanımı:
- Kontur ve yüzey ölçüm sistemi
- Makine üreticisi:
- Chotest
- Model:
- SJ5760
- Üretim yılı:
- 2024
- Durumu:
- yeni gibi (sergi parçası)
- Çalışma saati:
- 15 h
Fiyat ve Konum
EXW sabit fiyat KDV hariç
€18.900
- Konum:
- Mühlstraße 41, 71229 Leonberg, Deutschland

Ara
Teklif detayları
- Listeleme kimliği:
- A20678575
- Son güncelleme tarihi:
- 04.12.2025
Açıklama
Precise Profile Measuring Device | Excellent Condition | Ready for Immediate Use
For sale is a Chotest SJ-5760P, a high-precision contour measuring instrument for geometric profile analysis in quality management, tool making, mechanical engineering, and research applications. The device delivers exact measurements with extensive maneuverability and features a stable granite base.
———
Condition
• Used, technically inspected
• Fully operational
• In excellent, well-maintained condition
———
Technical Highlights – Chotest SJ-5760P
Travel Ranges
• X-axis: 0–200 mm
• Z-axis: 0–450 mm
• Device dimensions: 800 × 450 × 1100 mm
Bodpfx Ahjx Db Sts Islr
• Weight: 220 kg
———
Profile Measurement (SJ-5760P)
• Measuring range Z1: ±25 mm
• Resolution: 0.001 µm
• Measuring direction: Top / Down
• Measuring speed: 0.05–5 mm/s
• Positioning speed: X/Z up to 20 mm/s
• Measuring force: 10–150 mN, adjustable
• Guideway deviation: ≤1 µm / 200 mm
Accuracy
• X display error: ±(0.5 + 0.015L) µm
• Z1 display error: ±(0.5 + 0.05H) µm
• Distance: ±(0.8 + 0.02L) µm
• Radius: ≤(1 + R/15) µm
• Angle: ≤±45''
———
Device Features
• Ideal for highly precise contour and profile measurements
• Extremely high vertical resolution (0.001 µm)
• Very stable granite base for vibration-free measuring operation
• Large travel ranges for diverse component geometries
• User-friendly and reliable measuring technology
• Suitable for micron-accurate form measurements in laboratory and production settings
Bu ilan otomatik olarak tercüme edildiğinden bazı çeviri hataları oluşmuş olabilir.
For sale is a Chotest SJ-5760P, a high-precision contour measuring instrument for geometric profile analysis in quality management, tool making, mechanical engineering, and research applications. The device delivers exact measurements with extensive maneuverability and features a stable granite base.
———
Condition
• Used, technically inspected
• Fully operational
• In excellent, well-maintained condition
———
Technical Highlights – Chotest SJ-5760P
Travel Ranges
• X-axis: 0–200 mm
• Z-axis: 0–450 mm
• Device dimensions: 800 × 450 × 1100 mm
Bodpfx Ahjx Db Sts Islr
• Weight: 220 kg
———
Profile Measurement (SJ-5760P)
• Measuring range Z1: ±25 mm
• Resolution: 0.001 µm
• Measuring direction: Top / Down
• Measuring speed: 0.05–5 mm/s
• Positioning speed: X/Z up to 20 mm/s
• Measuring force: 10–150 mN, adjustable
• Guideway deviation: ≤1 µm / 200 mm
Accuracy
• X display error: ±(0.5 + 0.015L) µm
• Z1 display error: ±(0.5 + 0.05H) µm
• Distance: ±(0.8 + 0.02L) µm
• Radius: ≤(1 + R/15) µm
• Angle: ≤±45''
———
Device Features
• Ideal for highly precise contour and profile measurements
• Extremely high vertical resolution (0.001 µm)
• Very stable granite base for vibration-free measuring operation
• Large travel ranges for diverse component geometries
• User-friendly and reliable measuring technology
• Suitable for micron-accurate form measurements in laboratory and production settings
Bu ilan otomatik olarak tercüme edildiğinden bazı çeviri hataları oluşmuş olabilir.
Belgeler
Tedarikçi
Not: Ücretsiz kaydolun veya giriş yapın, tüm bilgilere erişmek için.
İlk kayıt tarihi: 2023
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