Kullanılmış Bruker Microflex satın al (4)

Durum: ikinci el, Dieses Angebot bezieht sich auf das Bruker microflex Massenspektrometer. Das Gerät befindet sich in einwandfreiem, voll funktionsfähigem Zustand und ist sofort einsatzbereit. Das Bruker Microflex ist ein Matrix-unterstütztes Laser-Desorptions/Ionisations-Flugzeit-Massenspektrometer (MALDI-TOF MS), das in erster Linie für die schnelle Identifizierung von Mikroorganismen, Biomolekülen (wie Proteinen und Peptiden) sowie Polymeren eingesetzt wird. Es gehört zur MALDI Biotyper-Serie von Bruker. Wesentliche Komponenten: - Laserquelle: Stickstoff- oder Festkörperlaser (in der Regel 337 nm UV) - Ionenquelle: Vakuumkammer mit MALDI-Probenplatte - Flugrohr: Misst die Flugzeit der Ionen - Detektor: Wandelt die Ankunftszeiten der Ionen in ein Massenspektrum um - MALDI-Probenplatte: Metallplatte zur Auftragung der mit Matrix vermischten Proben Funktionsweise (vereinfacht): 1. Probenvorbereitung: Analyten werden mit einer MALDI-Matrix (z. B. α-Cyano-4-hydroxyzimtsäure) vermischt. 2. Laserionisation: Der Laser trifft auf die Matrix und ionisiert dadurch die Probe. 3. Ionenbeschleunigung: Die Ionen werden in den TOF-Analysator beschleunigt. 4. Detektion: Die Flugzeit wird gemessen; kleinere Ionen erreichen den Detektor schneller. 5. Spektrum: Das Massen-zu-Ladungsverhältnis (m/z) wird gegen die Intensität aufgetragen. Physikalische Daten (ca.): - Stellfläche: Tischgerät (ca. 80 cm Breite) Fgsdpfx Akoxhdxqs Tjd - Gewicht: ca. 100–120 kg (modellabhängig) - Stromversorgung: Standard-Labornetzanschluss - Umgebung: Erfordert saubere, stabile Temperatur- und Feuchtigkeitsbedingungen

Durum: ikinci el, Tip: Tensor 27 IR spektrometresi Tam örnek esnekliği. Geliştirilmiş QuickLockTM mekanizması ve ön taraftaki kilitleme düğmesi sayesinde, hacimli aksesuarlar bile hızlı ve en önemlisi güvenli bir şekilde monte edilebilir. Ayrıca, INVENIO üç yazılım kontrollü ışın çıkışı ile çeşitli harici modüller için donatılabilir. FPA mikro ve makro görüntüleme Bireysel deneyler için değişken dış numune odası (sol veya sağ) Sıvı ve katılar için fiber optik prob bağlantısı Entegrasyon küresi Sıvılar için otosampler Yüksek verimli analiz modülü HTS-XT Hava-su faz sınırı için yansıma ünitesi Ve daha fazlası! Durum: kullanılmış Teslimat kapsamı: (bkz. resim) (Teknik verilerde değişiklik ve hatalar mümkündür, bilgiler bağlayıcı değildir!) Fgsdpfx Aozh D Nvek Tjd Daha fazla sorunuz için telefonla yardımcı olmaktan memnuniyet duyarız.

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Durum: mükemmel (kullanılmış), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive graphical user interface (GUI) operating under Microsoft Windows XP Professional. Equipment configuration and key features: - Magnification range: 5x – 300,000x - Acceleration voltage: 0.3 – 30 kV - Tungsten filament cathode (LaB6 cathode optional) - Large fully-motorized specimen stage with eccentric tilt, including: - Graphical navigation on the specimen holder - Easy specimen navigation via click-center-zoom - Field-of-view controlled navigation using 2 navigators - Relative coordinate navigation - Saving and recalling specimen positions - Adjustable image area selection for the stage - Image field correction during rotation via computer-controlled eccentric rotation - Image field correction during tilt via computer-controlled eccentric tilt - Calculation of permissible tilt angle based on specimen geometry - Auto focus tracking during Z-axis movements - Intelligent limit switches for motorized axes - Specimen stage travel range: x = 125 mm, y = 100 mm, z = 5–80 mm (stepless), T = -10°C to +90°C, R = 360° (continuous) - Secondary electron detector for high vacuum operation - Newly designed super-conical objective lens ensures maximum image resolution even at high tilt angles - Guaranteed resolution in SE imaging: 3 nm at 30 kV, 15 nm at 1 kV - Simultaneous live image display from multiple detectors - Powerful image measurement functionalities - Movie mode for recording dynamic processes - Versatile specimen chamber with multiple upgrade options: open ports for EDX, WDX, EBSD, cathodoluminescence, etc. - Maintenance-free, low-wear, quiet pump system consisting of a fore-vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control - Comprehensive error protection against operator errors and external media failures - Ergonomic, height-adjustable system table - SEM starter kit including 2 specimen holders, tool kit, and 6 spare cathodes Additional equipment for Scanning Electron Microscope: - Turbomolecular pump (in place of standard diffusion pump) - When using a turbomolecular pump, no cooling water is required for SEM operation. Further SEM equipment: - PC for SEM control incl. TFT monitor - OX200 Bruker Quantax 200 EDX System EXTENDED - Bruker EDX software license will be transferred to the new owner after purchase! - Nitrogen-free energy-dispersive X-ray analysis system including: - SDD detector with 127 eV or better energy resolution - Detection of all elements from boron upwards - Vibration-free, maintenance-free, Peltier-cooled (nitrogen-free) - Pulse processor - TFT monitor - Spectrum measurement and element identification - Fully-automatic, quantitative, standardless element analysis - Image acquisition - Ultra-fast qualitative line scan - Ultra-fast qualitative element mapping - Data management and archiving system - Report generation and result output - Data communication - Installation and training - HyperMap - Multipoint analysis - Bruker xFlash detector (SDD) with signal processing unit SVE III Scope of delivery: (See photos) Condition: used Fgodpfx Akezd Ufaj Tod (Technical data subject to change and errors excepted!)